Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy

Microscopy and Microanalysis(2023)

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Journal Article Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy Get access Ilona Müllerová, Ilona Müllerová Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic Corresponding author: ilona.mullerova@isibrno.cz Search for other works by this author on: Oxford Academic Google Scholar Ivo Konvalina, Ivo Konvalina Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Martin Zouhar, Martin Zouhar Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Aleš Paták, Aleš Paták Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Benjamin Daniel, Benjamin Daniel Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Lukáš Pru˚cha, Lukáš Pru˚cha Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Jakub Piňos, Jakub Piňos Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Eliška Materna Mikmeková Eliška Materna Mikmeková Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1861–1862, https://doi.org/10.1093/micmic/ozad067.960 Published: 22 July 2023
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关键词
graphene,spectroscopy,electron,time-of-flight
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