Cavity Mode-Matching InGaN Aperture-Emitting Device with a Nanoporous GaN Reflector via Ion Implantation

Cavity mode-matching InGaN resonant-cavity light-emitting diodes (RC-LEDs) with aperture size-dependent emission have been demonstrated through nitrogen ion (N+) implantation and electrochemical wet etching processes. The RC-LED structure consisted of 570 nm-depth ion-implanted regions and an embedded 17-pair nanoporous-GaN/n-GaN distributed Bragg reflector (DBR) outside the aperture, while there existed a full 20-pair DBR structure within the aperture regions. Shorter and mode-matching cavity lengths were fabricated, confirmed by transmission electron microscopy and angle-resolved photoluminescence spectra inside the aperture area without subjecting to the N+ implantation. By reducing the aperture sizes, higher current density and narrower far-field electroluminescence emission patterns were observed in the RC-LED with an aperture size of 40 μm-diameter. These results demonstrate that the cavity mode-matching RC-LEDs with optical/electrical confinements and controllable cavity length mismatch features can be applied in a wide range of optoelectronic-based device applications.