Field and charge distribution at semicon/polyethylene interfaces from combinations of probe force microscopy measurements

Two modes of Atomic Force Microscopy, namely the Peak Force-Quantitative Nano Mechanics and the Kelvin Probe Force Microscopy, are used for the nanoscale characterization of semicon(SC)-polyethylene(PE) interfaces in a SC-PE-SC-sandwich. A combination of the two methods provides physical (local geometry, roughness) and electrical (electric field, space charge) properties.