Identification and Characterization of Deep Nitrogen Acceptors in Β-Ga2o3 Using Defect SpectroscopiesHemant Ghadi,Joe F. Mcglone,Evan Cornuelle,Alexander Senckowski,Shivam Sharma,Man Hoi Wong,Uttam Singisetti,Ymir Kalmann Frodason,Hartwin Peelaers,John L. Lyons,Joel B. Varley,Chris G. van de Walle,Aaron Arehart,Steven A. RingelAPL MATERIALS（2023）引用 7|浏览28关键词Field-Effect TransistorsAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
