Degradation Analysis of the Pinned Photodiode CMOS Image Sensors Induced by Energetic Proton Radiation

Zujun Wang,Yuanyuan Xue,Zhongming Wang,Wei Chen,Liyuan Yin,Xinghong Wang,Xu Nie,Shankun Lai,Gang Huang,Maocheng Wang,Lili Ding,Baoping He,Wuying Ma,Shilong Gou

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment（2023）

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关键词

CMOS image sensor,Dark signal,Displacement damage,Fixed pattern noise (FPN),Pinned photodiode (PPD),Proton radiation,Temporal noise,Total ionizing dose (TID)

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