Multipactor Dynamic Modeling with Variable Secondary Emission Property Caused by Damage Accumulation

Surface treatments for suppressing secondary emission yield (SEY) are practically adopted for preventing multipactor occurrence within powerful microwave devices. Nonetheless, the damage accumulated in ground experiment test or during onboard operation is potential to cause unexpected SEY increment, which accordingly provokes the relapse risk of multipactor breakdown. In this research, we experimentally measures the SEY variance with energetic electron collisions and investigates the underlying mechanism. Furthermore, long-term dynamic evolution of multipactor with increasing SEY distribution is obtained with nonstationary statistical modeling to evaluate the effect of the damage accumulation on the multipactor onset condition. Meanwhile, the varying multipactor susceptibility zone and the multpactor threshold fluctuation versus the damage accumulation are calculated. This research is able to provide an evaluation method of spaceborne device lifetime with multipactor relapse risk caused by the damage accumulation.