Sub-Cycle Metallization of SiO2 Nanoparticles Probed via Carrier-Envelope Phase Dependent Electron Acceleration

We employ few-cycle pulses (4.5 fs duration centered at 720 nm) with controlled carrier-envelope phase (CEP) to probe the metallization of 95 nm diameter SiO ₂ nanoparticles. The momenta of photoemitted electrons from nanoparticles are recorded via high-energy Stereo Time-Of-Flight (Stereo-TOF) spectroscopy for each laser shot.