Three-Temperature Modeling of Laser Excitation in Silicon and Parametric Dependence of Damage Threshold
2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)（2023）
Key words
carrier-phonon dynamics,density-dependent two-temperature model,electron dynamics,finite difference time domain method,impact ionization,laser excitation,laser-excitation process,nanostructured materials,one-dimensional three-temperature model,photoabsorption,quasitemperatures,semiconductor materials,Si/el
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