Non-destructive Direct Pericarp Thickness Measurement of Sorghum Kernels with Fiber-based Extended Focus Optical Coherence Microscopy

D. Sen, A. Fernández, D. Crozier, B. Henrich,A. Sokolov,M. Scully,W. Rooney,A. Verhoef

2023 Conference on Lasers and Electro-Optics (CLEO)（2023）

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摘要

We apply high-resolution Bessel-beam extended focus optical coherence microscopy for non-destructive morphological phenotyping of sorghum seeds. We obtain accurate thickness measurements with a reduced tendency to overestimate the thickness of thin phenotypes.

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关键词

Bessel beam illumination,biological studies,constant small beam size,deteriorates,fiber long-period grating,fiber-based extended focus optical coherence microscopy,focusing conditions,geometrical focus,higher-order-mode fiber,ideal Bessel beam,lateral resolution,light source,medical studies,nondestructive direct pericarp thickness measurement,nondiffracting,noninvasive measurements,OCT systems,optical coherence tomography,practical realizations,practical terms,propagation direction,sharp central peak,sharper focus,sorghum kernels,standard single mode fiber,technological studies

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