Degradation Processes and Aging in Quantum Dot Lasers on Silicon

Matteo Meneghini,Matteo Buffolo,Michele Zenari,Carlo De Santi,Robert W. Herrick,Chen Shang,Yating Wan,Kaiyin Feng,Eamonn Hughes,John Bowers,Gaudenzio Meneghesso,Enrico Zanoni

2023 Conference on Lasers and Electro-Optics (CLEO)（2023）

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摘要

We discuss the physical processes for the degradation of quantum-dot lasers epitaxially grown on silicon. Through combined electro-optical measurements and deep-level transient spectroscopy, we conclude a pathway to obtain significant improvement in device lifetime.

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关键词

combined electro-optical measurements,deep-level transient spectroscopy,degradation processes,physical processes,quantum dot lasers,quantum-dot lasers

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