Reliability of WBG, results of a Pre-Scoping Study

Kaichen Zhang,Francesco Iannuzzo, Christian Holm Christiansen

2023 25TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS, EPE'23 ECCE EUROPE（2023）

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摘要

This report contains the outcome of this first study on the reliability of Wide Band Gap (WBG) components and WBG-based applications. By summarizing key findings, it leads to an outlook and discusses the next steps.

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关键词

"Wide bandgap","Reliability ","Silicon Carbide (SiC)","Gallium Nitride (GaN)","Device application"

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