Methodology for Jitter Analysis in Digital Storage Oscilloscope

As data rates consistently increase, timing margins in high-speed digital circuits are decreasing dramatically, and signal integrity (SI) is severely challenged by jitter. Jitter analysis has become an effective means of assessing SI and plays a role in high-speed system design. With the development of digital storage oscilloscope (DSO), increasing waveform storage depth provides sufficient raw data for jitter analysis, making jitter analysis a necessary function of high-end DSO. This paper focuses on the methodology for jitter analysis and its implementation in DSO. Comparison experiments with other commercial oscilloscopes show that the jitter analysis methodology presented in this paper exhibits high accuracy.