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Addressing the Effect of Stacking Faults in X-ray Diffractograms of Graphite Through Atom-Scale Simulations

Pascal Puech, Mathilde Jeanningros, David Neumeyer,Marc Monthioux

CARBON TRENDS(2023)

Cited 4|Views11
Key words
X-ray diffraction,Graphite,Structure,Stacking faults, Modeling
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