Enhanced artificial intelligence technique for soft fault localization and identification in complex aircraft microgrids

-In recent years, the aviation industry has witnessed a substantial integration of power electronics technology within Aircraft Microgrids (AMs). Consequently, the extension of electrical wiring networks has expanded, resulting in heightened intricacies within these systems. Therefore, the identification and location of faults in wiring networks have become an important topic in AMs to guarantee the safety of the electrical power systems. Time Domain Reflectometry (TDR) is widely used to locate and recognize electric wire faults. However, soft fault location on complex electrical networks using TDR is perplexing due to its weak effect on the reflected signal. Moreover, the existence of noise in the environment can worsen the TDR's performance. In this paper, a new approach based on TDR, along with the Subtractive Correlation Method (SCM) and Neural Network (NN), is proposed. The TDR response of the complex wiring network is determined using a newly proposed model based on the Finite Difference Time Domain (FDTD) method. The validity of the proposed model is established through experimentation including two distinct cable types also the introduced model notably enhances computational efficiency, a fact substantiated by our experimental findings and an extensive benchmarking against recent publications. These evaluations collectively underscore a significant reduction in computational time. Then, the reflected signal undergoes processing through SCM, a technique employed to amplify the subtle influence of the soft fault in two scenarios: one accompanied by noise and the other noise-free. Furthermore, NN is used to handle the inverse problem of localizing and characterizing the soft faults by their exact resistance values. Even within noisy environments, the proposed methodology excels in accurately locating and characterizing soft faults with a high degree of precision, all in real-time diagnostic scenarios.