Design and Fabrication of Devices for Characterization of Cold Parameters in Self-Assembled Metal Helices
2022 23rd International Vacuum Electronics Conference (IVEC)(2022)
摘要
We describe the design and fabrication of devices for on-chip measurements of insertion and return loss in self-assembled helical slow-wave structures on Si substrates.
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关键词
Self-assembly,nanomembranes,microscale helices,scalability,S-parameters
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