SiC Based Beam Monitoring System for Particle Rates from kHz to GHz
Journal of Instrumentation(2023)
摘要
The extremely low dark current of silicon carbide (SiC) detectors, even after high-fluence irradiation, was utilized to develop a beam monitoring system for a wide range of particle rates, i.e., from the kHz to the GHz regime. The system is completely built from off-the-shelve components and is focused on compactness and simple deployment. Beam tests using a 50 um thick SiC detector reveal, that for low fluences, single particles can be detected and counted. For higher fluences, beam properties were extracted from beam cross sections using a silicon strip detector. Overall accurate results were achieved up to a particle rate of 109 particles per second.
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