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Time-dependent Statistical NBTI Model for Aging Assessment in Circuit Level Implemented with Open Model Interface

Mingyue Zheng,Wangyong Chen,Yaoyang Lyu,Haifeng Chen,Jiahui Chen,Linlin Cai

MICROELECTRONICS RELIABILITY（2023）

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Key words
Negative Bias Temperature Instability,Statistical model,Circuit aging fluctuation,Open-model interface,Simulation
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