Modeling the electrical characteristic and degradation mechanisms of UV-C LEDs

Nicola Roccato,Francesco Piva,Carlo De Santi,Matteo Buffolo, Normal Susilo, Daniel Hauer Vidal,Anton Muhin,Luca Sulmoni,Tim Wernicke, Micheal Kneissl,Gaudenzio Meneghesso,Enrico Zanoni,Matteo Meneghini

2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)（2023）

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摘要

In this paper, we investigated the degradation mechanisms that negatively affect the reliability of UV-C LEDs. In particular, we modeled the process that involves trap generation identified through experimental electrical characteristics and contact degradation by means of numerical TCAD simulations.

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关键词

UV-C LED,Light-Emitting Diodes,simulations,Trap-Assisted Tunneling,contact,modeling

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