Applications of spectroscopic ellipsometry for multilayer analysis of CdTe solar cell structures incorporating Magnesium–Zinc oxide high resistivity transparent layers
SOLAR ENERGY MATERIALS AND SOLAR CELLS(2023)
摘要
An optical function parameterization of polycrystalline MgxZn1-xO (MZO) thin films as a function of bandgap Eg has been utilized in applications for the metrology of CdTe-based solar cell structures that incorporate MZO thin films as high resistivity transparent (HRT) layers. Parametric expressions are applied to facilitate mapping spectroscopic ellipsometry (M-SE) of device structures consisting of glass/SnO2:F/MZO. M-SE is shown to provide maps in the MZO effective thickness and bandgap within confidence limits of ± 1 nm and ± 0.003 eV, respectively. As a second application of these parametric expressions, an as-deposited glass/SnO2:F/MZO/CdS/CdTe device structure has been analyzed by through-the-glass spectroscopic ellipsometry (TG-SE). Such an analysis is also shown to provide the MZO effective thickness and bandgap. The outcome of the TG-SE analysis for this device structure enables simulations of the external quantum efficiency (EQE) spectrum of the resulting solar cell assuming different recombination losses within the individual layers of the structure. A comparison of these simulations with the experimental EQE spectrum reveals improved current collection from the front of the device incorporating an MZO HRT layer.
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关键词
MgxZn1-xO,Optical properties,Spectroscopic ellipsometry,CdTe photovoltaics
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