A method for industrial process fault diagnosis based on stacked denoising autoencoders and outlier detection algorithm.

Yupeng Lu,Tingzhang Liu,Kan Tang, Hui Qiao

2023 IEEE 18th Conference on Industrial Electronics and Applications (ICIEA)(2023)

引用 0|浏览4
暂无评分
摘要
This paper proposes a fault diagnosis method for industrial processes. For relatively complex processes with abundant data, a stacked denoising autoencoder (SDAE) is utilized to extract data features. Deep features are obtained through pre-training and fine-tuning. Additionally, outlier detection algorithm is employed to diagnose the occurrence of fault patterns. The proposed method is tested using the Tennessee Eastman (TE) chemical process dataset and compared with other fault diagnosis methods in terms of specific fault recognition accuracy. Experimental results demonstrate the correctness and effectiveness of the proposed method in this paper.
更多
查看译文
关键词
SDAE,outlier detection,fault diagnosis,unsupervised learning,industrial processes
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要