Temperature-drift effect analysis of microstrip filters based on parallel high-order DGTD and FETD method with memory reduction technique

The temperature-drift effect of microstrip filters is analyzed by the proposed electromagnetic-thermal co-simulation method based on parallel high-order discontinuous Galerkin time domain (DGTD) and finite-element time-domain (FETD) algorithms with a memory reduction technique. The element matrices of DGTD method are factorized into the product of coefficient matrices and universal matrices. The coefficient matrices are different for each tetrahedral element and need to be stored for all the elements. While the universal matrices are the same for all the tetrahedral elements and only need to be stored for one element. Since the sizes of the coefficient matrices are much smaller than the element matrices of DGTD method, the proposed method avoids storing the large element matrices and greatly reduce the memory requirement of the DGTD method. Thus it reduces the memory requirement of the whole electromagnetic-thermal co-simulation which is dominated by the memory consumption of the DGTD method. Large-scale parallel technique is adopted to accelerate the process of electromagnetic-thermal co-simulation. The proposed method provides a very powerful tool for temperature-drift effect analysis of microstrip filters.