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Critical Ising System Testing of High-Quality Random Number Generators

Dongjie Zhu, Yun Lin,Guoya Sun,Fuming Wang, Mingyang Zhao,Yanwei Chen,Jizheng Duan

JOURNAL OF STATISTICAL MECHANICS-THEORY AND EXPERIMENT(2023)

Cited 1|Views13
Key words
critical Ising system,Monte Carlo,pseudorandom number generator,FPGA
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