Towards knowledge-enhanced process models for semiconductor fabrication

Tom Rothe, Mudassir Ali Sayyed,Jan Langer, Knut Gottfried,Jörg Schuster,Martin Stoll,Harald Kuhn

2023 IEEE INTERNATIONAL INTERCONNECT TECHNOLOGY CONFERENCE, IITC AND IEEE MATERIALS FOR ADVANCED METALLIZATION CONFERENCE, MAM, IITC/MAM(2023)

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摘要
We present a novel approach for modeling semiconductor processing that uses machine learning to combine expert knowledge, physics models, and actual process data into so-called knowledge-enhanced process models. Our method is illustrated on models for chemical-mechanical planarization, a key technology for semiconductor processing. It is an important step towards robust, accurate, and transferable, real-time models for digital twins of semiconductor processes and process chains.
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关键词
semiconductor process modeling, physics-informed machine learning, chemical-mechanical planarization
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