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C1.1 - One-Step Traceability with NIST on a Chip: A Case for the Emergence of Quantum-Based Methods for Metrology and Sensing of Pressure, Vacuum, Temperature, Electric Fields, Mass, Force, and Torque, All Enabled by the New SI

J. Hendricks, B. Goldstein,A. Artusio-Glimpse,C. Holloway,M. Simons,N. Prajapati,A. Rotunno,S. Berweger,N. Klimov,Z. Ahmed,D. Barker,S. Eckel,J. Fedchak,J. Ricker,K. Douglass,T. Herman, M. Chojnacky,J. Scherschligt,S. Schlamminger,L. Chao, Z. Comden, J. Draganov, T. Bui, K. Campbell,M. Jayaseelan

Lectures（2023）

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