Physics-informed Bayesian Optimization of an Electron Microscope.

Journal Article Physics-informed Bayesian Optimization of an Electron Microscope Get access Desheng Ma, Desheng Ma School of Applied and Engineering Physics, Cornell University, Ithaca, NY, US Corresponding author: dm852@cornell.edu, dm24@cornell.edu Search for other works by this author on: Oxford Academic Google Scholar Chenyu Zhang, Chenyu Zhang School of Applied and Engineering Physics, Cornell University, Ithaca, NY, US Search for other works by this author on: Oxford Academic Google Scholar Yu-Tsun Shao, Yu-Tsun Shao School of Applied and Engineering Physics, Cornell University, Ithaca, NY, US Search for other works by this author on: Oxford Academic Google Scholar Zhaslan Baraissov, Zhaslan Baraissov School of Applied and Engineering Physics, Cornell University, Ithaca, NY, US Search for other works by this author on: Oxford Academic Google Scholar Cameron Duncan, Cameron Duncan School of Applied and Engineering Physics, Cornell University, Ithaca, NY, US Search for other works by this author on: Oxford Academic Google Scholar Adi Hanuka, Adi Hanuka SLAC National Laboratory, Menlo Park, CA, US Search for other works by this author on: Oxford Academic Google Scholar Auralee Edelen, Auralee Edelen SLAC National Laboratory, Menlo Park, CA, US Search for other works by this author on: Oxford Academic Google Scholar Jared Maxon, Jared Maxon Cornell Laboratory for Accelerator-Based Science and Education, Cornell University, Ithaca, NY, US Search for other works by this author on: Oxford Academic Google Scholar David Muller David Muller School of Applied and Engineering Physics, Cornell University, Ithaca, NY, US Corresponding author: dm852@cornell.edu, dm24@cornell.edu Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1875–1877, https://doi.org/10.1093/micmic/ozad067.968 Published: 22 July 2023