Quantitative Analysis of Transition Metal Oxides at Low Accelerating Voltage with the Soft X-ray Emission Spectrometer.

Journal Article Quantitative Analysis of Transition Metal Oxides at Low Accelerating Voltage with the Soft X-ray Emission Spectrometer Get access Masaru Takakura, Masaru Takakura SA Business Unit JEOL Ltd., Akishima, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Takanori Murano, Takanori Murano SA Business Unit JEOL Ltd., Akishima, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Shogo Koshiya, Shogo Koshiya SA Business Unit JEOL Ltd., Akishima, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Peter McSwiggen, Peter McSwiggen JEOL USA Inc., Peabody, MA, United States Search for other works by this author on: Oxford Academic Google Scholar Vernon Robertson Vernon Robertson JEOL USA Inc., Peabody, MA, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 178–180, https://doi.org/10.1093/micmic/ozad067.080 Published: 22 July 2023