EELS Characterization of Niobium Oxide Memristor Devices.

Journal Article EELS Characterization of Niobium Oxide Memristor Devices Get access Bradley T De Gregorio, Bradley T De Gregorio US Naval Research Laboratory, Washington, DC, USA Corresponding author: bradley.degregorio@nrl.navy.mil Search for other works by this author on: Oxford Academic Google Scholar Evgeniya Lock, Evgeniya Lock US Naval Research Laboratory, Washington, DC, USA Search for other works by this author on: Oxford Academic Google Scholar Keith Knipling, Keith Knipling US Naval Research Laboratory, Washington, DC, USA Search for other works by this author on: Oxford Academic Google Scholar Hans Cho Hans Cho US Naval Research Laboratory, Washington, DC, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 111–112, https://doi.org/10.1093/micmic/ozad067.048 Published: 22 July 2023