Hybrid SIMS: Secondary Ion Mass Spectrometry Imaging with High Mass Resolving Power.

Journal Article Hybrid SIMS: Secondary Ion Mass Spectrometry Imaging with High Mass Resolving Power Get access Felix Kollmer, Felix Kollmer IONTOF, Münster, Germany Corresponding author: felix.kollmer@iontof.com Search for other works by this author on: Oxford Academic Google Scholar Alexander Pirkl, Alexander Pirkl IONTOF, Münster, Germany Search for other works by this author on: Oxford Academic Google Scholar Julia Zakel, Julia Zakel IONTOF, Münster, Germany Search for other works by this author on: Oxford Academic Google Scholar Henrik Arlinghaus, Henrik Arlinghaus IONTOF, Münster, GermanyUniversity of Münster, Institute of Hygiene, Münster, Germany Search for other works by this author on: Oxford Academic Google Scholar Ewald Niehuis Ewald Niehuis IONTOF, Münster, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Page 748, https://doi.org/10.1093/micmic/ozad067.369 Published: 22 July 2023