Probing Dielectric Breakdown in Single Crystal Hexagonal Boron Nitride.

Journal Article Probing Dielectric Breakdown in Single Crystal Hexagonal Boron Nitride Get access Alok Ranjan, Alok Ranjan Department of Physics, Chalmers University of Technology, Gothenburg, Sweden Corresponding authors: alok.ranjan@chalmers.se, eva.olsson@chalmers.se Search for other works by this author on: Oxford Academic Google Scholar Andrew B Yankovich, Andrew B Yankovich Department of Physics, Chalmers University of Technology, Gothenburg, Sweden Search for other works by this author on: Oxford Academic Google Scholar Kenji Watanabe, Kenji Watanabe National Institute of Materials Science, Tsukuba, Japan Search for other works by this author on: Oxford Academic Google Scholar Takashi Taniguchi, Takashi Taniguchi National Institute of Materials Science, Tsukuba, Japan Search for other works by this author on: Oxford Academic Google Scholar Eva Olsson Eva Olsson Department of Physics, Chalmers University of Technology, Gothenburg, Sweden Corresponding authors: alok.ranjan@chalmers.se, eva.olsson@chalmers.se Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1998–2000, https://doi.org/10.1093/micmic/ozad067.1034 Published: 22 July 2023