Stably Saturated Output Current Characteristics and Hot-Carrier Reliability of A-Ingazno Thin-Film Transistors with Source-Connected Field Plate
IEEE Transactions on Electron Devices（2023）
Key words
Active-matrix organic light-emitting diode (AM-OLED),amorphous indium-gallium-zinc oxide (a-IGZO),field plate,hot-carrier stress (HCS),saturated output current characteristic,thin-film transistor (TFT)
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