Implantation-decay method to study the β -delayed charged particle decay

In this paper, the implantation-decay method is introduced to study the β -delayed charged particle decay. A silicon detector array was used for the implantation of the incident beams and for the detection of the emitted particles. An experimental measurement on the β -delayed particle emission from ^22 Al was used to demonstrate the method. The half-life value, charged particle spectroscopy, γ ray spectrum, and γ particle coincidence for the decay process were obtained and compared with previous experimental results for ^22 Al. The results show that the implantation-decay method, using a silicon detector array, is a suitable experimental method to study the β -delayed charged particle decay for proton-rich nuclei.