Performance Analysis of 1-MHz Voltage-Controlled Ring Oscillator Designed in 180-nm CMOS Technology for Phase-Locked Loop.

This paper presents a voltage-controlled ring oscillator designed and implemented in 180-nm CMOS technology to be used in a phase-locked loop. The performance of the circuit as a function of the temperature and supply voltage is measured. The measurements of the voltage-controlled oscillator are compared with the postlayout simulations.