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Application of a Low-Energy Electron Beam As a Tool for Ultrashort Bunch Length Measurement in Circular Machines

D. А. Nikiforov, K Rusinov,P. V. Logatchov,Alexandr Starostenko,Dmitriy Malyutin,Alexander Matveenko

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关键词
Environmental Scanning Electron Microscopy,Scanning Electron Microscopy
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