A deep learning solution for particle size analysis in low resolution inline microscopy images based on generative adversarial network

Martin Vagenknecht, Jindrich Soukup,Antong Chen,Roberto Irizarry

Powder Technology（2023）

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摘要

•Particle size analysis technique for inline process monitoring.•Elimination of manual labeling for training of supervised learning models for particle detection.•Deep learning for particle size analysis in low resolution inline microscopy images.

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关键词

Deep learning,Generative adversarial network,Convolutional neural network,Object detection,Object segmentation,Inline microscopy monitoring,Particle analysis

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