ID: 212051 EM Exposure During Non-Invasive Brain Stimulation Applications: Impact of Uncertainties on Treatment Relevant Metrics

Performance and safety of non-invasive brain stimulation (NIBS) techniques (e.g., transcranial electric stimulation (tES) or temporal interference stimulation (TIS)) rely on the precise delivery of stimulation dose (typically electric (E-)field related quantities) to targets. The assessment of uncertainty associated with electromagnetic (EM) dose calculated by finite-element method (FEM) simulations using detailed anatomical human head models to optimize stimulation parameters (e.g., electrode positions, current intensities) and predict safety and performance metrics is therefore essential. We systematically investigated the impact of experimental and modelling sources of uncertainty/variability on tES exposure and exposure-derived quantities (maximum amplitude modulation for TIS, focality of stimulation, etc.).