Temperature-dependent Analysis and Correction in a Neutron Fluence Real-Time Measuring Circuit
MICROELECTRONICS RELIABILITY（2023）
关键词
Neutron fluence,Displacement damage,Temperature dependence,Bipolar junction transistor monitor
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要