Volume Electron Microscopy Protocol for the ASP-1000 v1
crossref(2022)
摘要
Volume electron microscopy (vEM) requires a multitude of heavy metal stains to ensure adequate sample contrast and conductivity under the electron beam. Bench protocols for vEM can be time- and labor-intensive. The mPrep™ ASP-1000™ automated specimen processor equipped with a thermal control unit reduces the amount of time and labor required for vEM protocols.
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