A Deeper Look into the Effects of Extended Defects in SiC Epitaxial Layers on Device Performance and ReliabilityHrishikesh Das,Swapna Sunkari,Joshua Justice,Danielle HamannMaterials Science Forum（2022）引用 1|浏览3AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
