Quasiparticle spectroscopy in technologically-relevant niobium using London penetration depth measurements

Sunil Ghimire,Kamal R. Joshi, Amlan Datta, Aidan Goerdt,Makariy A. Tanatar,Deborah Schlagel,Matthew J. Kramer,Jayss Marshall, Cameron J. Copas, Joshua Y. Mutus,Alexander Romanenko,Anna Grassellino,Ruslan Prozorov

arXiv (Cornell University)（2023）

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摘要

London penetration depth was measured in niobium foils, thin films, single crystals, and superconducting radio-frequency (SRF) cavity pieces cut out from different places. The low-temperature (T更多

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spectroscopy,technologically-relevant

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