CIGS degradation due to water ingress: post-mortem analysis of a field-exposed PV module
2022 IEEE 49th Photovoltaics Specialists Conference (PVSC)(2022)
摘要
To bridge the two worlds of the lab and the field, we propose an approach based on coring, unpackaging and post-mortem analysis. We show how in-depth lab-based characterization techniques can be applied on field-deployed PV modules to study the real outdoor degradation mechanisms. In this case, we aim to make a step forward in the understanding of CIGS degradation due to water ingress. A local analysis of both electrical and material properties on a severely degraded commercial module was performed, allowing to trace back the occurring water-induced degradation mechanisms. The degradation mainly affected the TCO layer, through the formation of Zn-based hydroxides, and the Mo back contact layer, which oxidized up to its complete corrosion of the P3 scribes. This resulted in a deterioration of the electrical properties, especially in terms of Rs increase, Voc reduction and Jsc limitation, before ruining the performance entirely at a more advanced stage of degradation.
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关键词
back contact layer,CIGS degradation,Cu(InGa)Se2/int,degraded commercial module,electrical properties,field-deployed PV modules,field-exposed PV module,in-depth lab-based characterization techniques,local analysis,material properties,Mo/el,outdoor degradation mechanisms,P3 scribes,post-mortem analysis,water ingress,water-induced degradation mechanisms,Zn-based hydroxides,Zn/el
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