CIGS degradation due to water ingress: post-mortem analysis of a field-exposed PV module

Simona Villa, Remi Anitat,Pelin Yilmaz,Aldo Kingma, Mikolaj Dziechciarz, Joran van den Berg,Klaas Bakker,Mirjam Theelen

2022 IEEE 49th Photovoltaics Specialists Conference (PVSC)(2022)

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摘要
To bridge the two worlds of the lab and the field, we propose an approach based on coring, unpackaging and post-mortem analysis. We show how in-depth lab-based characterization techniques can be applied on field-deployed PV modules to study the real outdoor degradation mechanisms. In this case, we aim to make a step forward in the understanding of CIGS degradation due to water ingress. A local analysis of both electrical and material properties on a severely degraded commercial module was performed, allowing to trace back the occurring water-induced degradation mechanisms. The degradation mainly affected the TCO layer, through the formation of Zn-based hydroxides, and the Mo back contact layer, which oxidized up to its complete corrosion of the P3 scribes. This resulted in a deterioration of the electrical properties, especially in terms of Rs increase, Voc reduction and Jsc limitation, before ruining the performance entirely at a more advanced stage of degradation.
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关键词
back contact layer,CIGS degradation,Cu(InGa)Se2/int,degraded commercial module,electrical properties,field-deployed PV modules,field-exposed PV module,in-depth lab-based characterization techniques,local analysis,material properties,Mo/el,outdoor degradation mechanisms,P3 scribes,post-mortem analysis,water ingress,water-induced degradation mechanisms,Zn-based hydroxides,Zn/el
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