Study on Calibration Method of IC Aging Test Systems under Comprehensive Working Conditions
Journal of Physics: Conference Series(2023)
摘要
Abstract Domestic IC aging test systems are mostly designed with poor consideration of traceability, and self-calibration solutions, which lack systematic overall measurement. According to the comprehensive working conditions characteristics of IC aging test systems, a systematic overall calibration method of the IC aging test systems is presented in this paper.
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关键词
ic aging test systems,calibration method
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