Improving Surge Current Capability of SBD-Embedded SiC-MOSFETs in Parallel Connection by Applying Bipolar Mode Activation Cells

2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD)(2023)

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摘要
A novel structure named bipolar mode activation cell (BMA cell) is demonstrated to prevent current crowding in parallel connections of SBD-embedded SiC-MOSFETs during a surge current event. In a BMA cell, where the SBD area is partly filled with p-body to inactivate the corresponding part of SBD, I-V characteristics are uniform for each parallel-connected device under a surge condition. The parallel-connected devices with BMA cell have more than 5 times higher surge current capability compared with the conventional devices owing to the absence of current crowding.
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关键词
SiC,MOSFET,SBD-embedded,bipolar degradation,bipolar transistor,reliability
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