Evaluation of SEU Impact on Convolutional Neural Networks Based on BRAM and CRAM in FPGAs
Microelectronics Reliability（2023）
Key words
CNN,Radiation tolerant,MNIST,FPGA,SEU,Pulsed laser
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined