Innovation Practices Track: Testability and Dependability of AI Hardware and Autonomous Systems

Fei Su, Eric Zhang,Arjun Chaudhuri,Michael Paulitsch

2023 IEEE 41st VLSI Test Symposium (VTS)（2023）

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摘要

Testability and dependability (e.g., safety) of AI hardware (e.g., GPU, AI accelerators) and AI-based autonomous systems has been emerging as an important R&D topic in order to address increasing resiliency. In this session we will invite the industry experts to discuss the various aspects of this new field.

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