Innovation Practices Track: VLSI Functional Safety

Fei Su, Meirav Nitzan, Ankush Sethi, Vaibhav Kumar, Dan Alexandrescu

2023 IEEE 41st VLSI Test Symposium (VTS)(2023)

引用 0|浏览3
暂无评分
摘要
In safety-critical applications, e.g., automotive, how to avoid or alleviate risk due to hazards caused by silicon/IC malfunction is a key field, aka functional safety (FuSa). While there have been several standards established for FuSa, e.g., ISO 26262, there are still many technical challenges in this field, for example, tradeoff between cost and effectiveness, new safety mechanism for transient, intermittent or degrading faults. In this session we invited the industry experts to present the latest developments in these domains and share their insights.
更多
查看译文
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要