High-Fidelity Reconstruction of Structured Illumination Microscopy by an Amplitude-Phase Channel Attention Network With Multitemporal Information.

IEEE Trans. Instrum. Meas.(2023)

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摘要
Structured illumination microscopy (SIM) has been a popular method for live-cell super-resolution (SR) imaging due to its excellent photon efficiency. However, SIM is always marred by artifacts in the reconstructed SR images. To address this problem, we develop an end-to-end amplitude-phase channel attention network (APCAN) for SIM reconstruction based on a priori frequency and temporal knowledge. The APCAN reinforces both amplitude and phase information of the raw images to guide network reconstruction and attains SR images with fewer artifacts. Moreover, inspired by the continuity knowledge in the traditional method, we design a temporal processing module in APCAN to utilize multiple time points data. Trained with the video dataset imaged from our setup, APCAN can reconstruct an artifact-minimized SR image, achieving a reduction of 38% in reconstruction errors. Finally, we demonstrate that the APCAN reconstructed images have great resistance to noise and photobleaching, achieving the best fidelity among all methods tested.
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关键词
structured illumination microscopy,attention,high-fidelity,amplitude-phase
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