Layout Hotspot Pattern Clustering Using a Density-based Approach

2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT)(2023)

引用 0|浏览1
暂无评分
摘要
Since the number of hotspot patterns detected on a layout using machine learning technique is very large, it takes designers a lot of time to classify these hotspot patterns for subsequent modification. These hotspot patterns are diverse and complex in shape. Therefore, we propose a density-based hotspot pattern clustering approach to classify these hotspot patterns into groups, which extracts the density feature of hotspot patterns while considering the shifted and distorted polygons on hotspot patterns. Experimental results show that our approach can classify the hotspot patterns more efficiently than SIFT method with similar results in each group.
更多
查看译文
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要