An Intelligent Monitoring Algorithm to Detect Dependencies between Test Cases in the Manual Integration Process

2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)(2023)

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摘要
Finding a balance between meeting test coverage and minimizing the testing resources is always a challenging task both in software (SW) and hardware (HW) testing. Therefore, employing machine learning (ML) techniques for test optimization purposes has received a great deal of attention. However, utilizing machine learning techniques frequently requires large volumes of valuable data to be trained. Although, the data gathering is hard and also expensive, manual data analysis takes most of the time in order to locate the source of failure once they have been produced in the so-called fault localization. Moreover, by applying ML techniques to historical production test data, relevant and irrelevant features can be found using strength association, such as correlation- and mutual information-based methods. In this paper, we use production data records of 100 units of a 5G radio product containing more than 7000 test results. The obtained results show that insightful information can be found after clustering the test results by their strength association, most linear and monotonic, which would otherwise be challenging to identify by traditional manual data analysis methods.
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关键词
Test Optimization,Machine Learning,Fault Localization,Dependence Analysis,Mutual Information
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