Evaluation of radiation shielding parameters of SiO2-Na2O-K2O-P2O5-BaO glass system

Different glasses i.e. 20 SiO2-7.5 Na2O- 7.5 K2O- (65-x) P2O5- x BaO, have been synthesized using melt quench technique. The glass formation has been confirmed using X-Ray diffraction technique. The advance radiation shielding parameters (Build-up factor) has been evaluating using G-P fitting method. It is observed from results that EBF and EABF are maximum for GBa1 and minimum for GBa4 glass sample in the entire photon energy regime. Results revealed that EBF and EABF varies non-linearly in low photon energy regime due to photoelectric effect absorption role composition dependence. Whereas EBF and EABF, varies nearly linear in the mid and higher photon energy regions due to lower and insignificant compositional dependence respectively. Radiation analysis inferred that GBa4 containing 10 mol.% BaO is the most appropriate among other samples for absorption properties.