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Impact of Phase-Change Memory Drift on Energy Efficiency and Accuracy of Analog Compute-in-Memory Deep Learning Inference (Invited)

Martin M. Frank,Ning Li,Malte J. Rasch,Shubham Jain,Ching-Tzu Chen,Ramachandran Muralidhar,Jin-Ping Han,Vijay Narayanan,Timothy M. Philip,Kevin Brew,Andrew Simon,Iqbal Saraf,Nicole Saulnier,Irem Boybat,Stanislaw Wozniak,Abu Sebastian,Pritish Narayanan,Charles Mackin,An Chen,Hsinyu Tsai,Geoffrey W. Burr

2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS（2023）

Cited 3|Views83
Key words
Analog memory,in-memory computing,neural networks,phase change memory,semiconductor device reliability
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